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Test and Measurement

Length Cutting Optimization for Excel
May 16, 2012
1DCutX saves time, reduces raw material waste, and minimizes production costs.
Nikon Announces MCT225 Metrology CT System
May 14, 2012
Pre-calibrated solution provides absolute accuracy.
Novus FieldLoggers Version 1.2.2 Now Available
May 11, 2012
Upgrade improves export speed of all downloaded data, chart viewing.
Intergraph Releases TANK 2012 4.0
May 9, 2012
Solution includes updated API codes and enhancements for oil storage tank design and analysis.
Creaform Introduces C-Link for Faster Inspection
May 7, 2012
System includes TRUaccuracy technology for easier inspection of complex parts.
Tektronix Adds DSA8300 Support to OM4000 Optical Analyzer
May 4, 2012
Update boosts vertical resolution to 16 bits.
Apache Design Releases Redhawk for Sub-20 Nanometer Power Sign-off
May 2, 2012
ANSYS subsidiary addresses critical challenges for advanced low-power designs.
Agilent Will Purchase Centellax’s Test and Measurement Business
May 1, 2012
Acquisition will augment position in digital I/O and optical transceiver space.
Developing a Powertrain Test Bench
May 1, 2012
Dynacar combines digital and physical simulation to model powertrains for hybrid electric vehicles.
Moving into "Intelligent Engineering"
May 1, 2012
The Center for Advanced Engineering Environments assists researchers, industry and government partners with product creation and testing.
Hexagon Metrology Releases Optiv Classic 321GL tp
April 30, 2012
Benchtop vision measuring machine configured to add a touch probe for multi-sensor measurement.
3D Systems Expands Digitizer Offering Into Non-Destructive Testing
April 30, 2012
Provides solution for NDT in aerospace and defense applications.
E-Mark Releases New Pins in Test Point Range
April 23, 2012
Pins are used to afford secure attachment of scope probes and flying leads.
Microstar Releases Rotating Machinery Analysis Module
April 23, 2012
Makes mixed time and rotation measurements easy.
Hexagon Metrology Releases Latest Shop Floor Coordinate Measuring Machines
April 18, 2012
Next generation CMMs focused on portability.



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