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Test and Measurement

Faster Debugging of DDR Devices
Agilent tool works on 9000-Series oscilloscopes.
Yokogawa Launches First Precision Power Scope
PX8000 combines oscilloscope and power-analyzer technologies for time-based power measurements.
Hexagon Metrology Unveils WLS qFLASH White Light Measurement Solution
Portable solution can digitize data on the shop floor for fast analysis.
Keithley Enhances S530 Parametric Test System Capabilities
Solution provides comprehensive system diagnostics and expanded measurement functions.
HBM Releases Genesis HighSpeed 1kV Card
See dynamic data in real-time.
Agilent Introduces USB 3.0 SSIC and MIPI CSI-3 Protocol-Decoding Software
Protocol decoders run on 90000A, 90000 X- and 90000 Q-Series oscilloscopes.
Rogue Wave Software Acquires Klocwork
Company provides software development tools for secure code.
CMSC 2013 Measurement Study Report Released
Data collected from conference attendees used to build metrology study.
Agilent Technologies to Separate into Two Public Companies
Electronic measurement business to be distributed to shareholders through tax-free spinoff.
Saelig Introduces Precision Multi-layer Thickness Measurement System
OptiGauge MLS can measure translucent coatings in an object up to 20 layers thick.
Coordinate Metrology Society 2014 Call for Papers
Coordinate Metrology Systems Conference (CMSC) needs submissions by March 14.
Coord3 Metrology Ships BENCHMARK CMM
Compact unit designed for high-volume production part inspection.
Hexagon Metrology Unveils New Laser Tracker Probing System
Leica B-Probe extends applications for the Leica Absolute Tracker AT402 and the Ultra-Portable Large-Volume concept.
Remcom Announces Moving Radio Simulation Capability
Unveils new study on wind farm affect on radar returns.
LTE System Toolbox for MATLAB
New toolbox provides LTE-compliant reference for simulation and design verification of wireless communication systems and devices.



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