Keithley Enhances S530 Parametric Test System Capabilities

By DE Editors

Keithley Instruments introduced the latest upgrades to its S530 Parametric Test Systems.

The S530 Diagnostics and System Verification Tool expands diagnostic coverage for all system instrumentation and matrix pathways, the company says. Additionally, users can run the system verification tool to ensure the S530 is within its published system specifications. The diagnostic and system verification tool generates comprehensive results files, making it easier to share information with Keithley field service personnel or monitor trends in system health.

The upgrade includes a variety of new measurement capabilities and added flexibility to the Keithley Test Environment (KTE). S530 Parametric Test Systems running the new KTE V5.5 can address all of the I-V and C-V measurements required in process control monitoring,  process reliability monitoring, and device characterization, the company says.

In addition to the 200V system configuration that is typically used for standard CMOS, bipolar, MEMS, and other relatively low voltage semiconductor processes, Keithley developed a 1kV version optimized for the difficult breakdown and leakage tests that GaN, SiC, and Si LDMOS power devices require. To accommodate this expansion of the system’s range of applications, Keithley has also developed a taller system cabinet designed to house additional instrumentation and simplify overall system maintenance.

For more information, visit Keithley Instruments.

Sources: Press materials received from the company and additional information gleaned from the company’s website.