DYNAEIT Electric Impedance Tomography

By DE Editors

DYNAFLOW, Inc. (Jessup, MD) announces the development of DYNAEIT, a suite of efficient algorithms for solution of Electrical Impedance Tomography (EIT) problems.

EIT seeks to image the interior of a container based on variation of electrical properties. Using the boundary element method (BEM), DYNAEIT provides an accurate and efficient set of algorithms for identification of the container contents. The initial efforts to develop DYNAEIT were funded by two Small Business Innovation Research (SBIR) awards from the National Science Foundation (Arlington, VA).

In EIT the distribution of conductivity inside a container is sought by applying specified currents (or voltages) at portions of the container surface and performing measurements of the voltage (or currents) at other locations along the surface. The equations for the electric field then provide relationships between the conductivity distribution inside the domain and the measured voltages and currents. Different types of materials have different conductivities resulting in a conductivity map that provides an image of the material distribution in the container.

CPU-efficient methods, such as a Dipole Approximation method, and a Singular BEM are used to rapidly solve the “forward” problem of determination of voltage and current distributions for a known conductivity distribution in the imaged domain in 2 and 3 dimensions.

These EIT algorithms can be applied for medical imaging, multiphase flows encountered in chemical, oil and gas, energy, and aerospace industries, non-destructive evaluation of structures and materials, imaging of underground water paths and container leakage, archaeology, detection of buried objects, chemical reactive flows, and others.

For details, contact DYNAFLOW, Inc.

Sources:  Press materials received from the company and additional information gleaned from the company’s website.