Nikon Metrology, Inc. To Present Xtreme Scanning at Quality Expo

By DE Editors

Nikon Metrology announced that Alex Lucas, Business Development Manager of Scanning Products, will be presenting the Xtreme Scanning Innovation Brief at the Quality Show in Chicago. Real-life examples of how productivity has increased and costs reduced will be discussed.

The presentation is set to cover the latest advancements in CMM and handheld scanners, advantages of laser scanners, typical applications, Nikon Metrology product portfolios, and a video demonstration of Nikon Metrology’s Focus Inspection software.

For more information, visit Nikon Metrologyand Quality Expo.

Sources: Press materials received from the company and additional information gleaned from the company’s website.