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National Instruments

Editor’s Pick: Solution Automates Big Analog Data Handling
November 15, 2017
New NI software suite aims to simplify extracting insights from mountains of data.
Solution Automates Big Analog Data Handling
November 15, 2017
New NI software suite aims to simply extract insights from mountains of data.
Sponsored Content
Engineering for the Auto Industry
October 25, 2017
In this digital issue featuring some of DE’s most popular content on the subject, we take a deeper look at how automotive design engineers are responding to changing regulatory requirements, electric drivetrains and self-driving technologies.
NI Announces Automated Solution for Big Analog Data
October 24, 2017
The Data Management Software Suite from National Instruments is designed to enable a complete workflow for turning measurement data into actionable insights, the company reports.
NI Technology Improves Safety Test for Autonomous Vehicles
October 24, 2017
The new Vehicle Radar Test System delivers object simulation and radar measurement capabilities for engineers testing autonomous driving technology.
Editor’s Picks for October 12-18, 2017
October 19, 2017
One of the picks will be chosen as DE’s Editor’s Pick of the Week.
Editor’s Picks for October 5-11, 2017
October 12, 2017
One of the picks will be chosen as DE’s Editor’s Pick of the Week.
Editor’s Picks for August 3-9, 2017
August 11, 2017
One of the picks will be chosen as DE’s Editor’s Pick of the Week.
Editor’s Picks for July 27- August 2, 2017
August 3, 2017
One of the picks will be chosen as DE’s Editor’s Pick of the Week.
Sponsored Content
How to Tighten Your Automotive Embedded Devices Testing Loop
July 31, 2017
Hardware-in-the-loop simulations let you test, validate and optimize vehicular embedded devices from the earliest development while trimming back on costly field tests.
Speed Test System Design and Deployment
June 28, 2017
Standardized components and rack assemblies said to help simplify and lower the cost of automated test systems.
Sponsored Content
Editor’s Pick: Speed Test System Design and Deployment
June 28, 2017
Standardized system components and rack assemblies said to help simplify and lower the cost of automated test systems.
Editor’s Pick: New Generations of LabVIEW Unveiled
June 14, 2017
LabVIEW Next Generation engineering system design software debuts, offers access for non-programmers.
New Generations of LabVIEW Unveiled
June 14, 2017
LabVIEW Next Generation engineering system design software debuts, offers access for non-programmers.
NI Offers Baseband Model of Vector Signal Transceiver
June 9, 2017
Second-generation transceiver has greater bandwidth, a smaller footprint and a larger user-programmable FPGA, according to the company.



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