Check it Out: Virtual Summit Explores Embedded Technologies
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December 4, 2001
By Anthony J. Lockwood
Dear Desktop Engineering Reader:
Fair warning: You’re going to have to rummage about a bit at the other side of the link because there’s too much to write about and too little space for me to do it.
See, from September 18th through 20th, National Instruments will hold the second edition of its 2012 Embedded Technology Summit. You don’t have to go to some isolated hotel to attend. You can do it from your desk. It’s a virtual summit. No session fees; you register online only for the sessions that interest you. No hassles at the airport. No begging the honchos to fund a trip. This is an event that you should check out. Here’s why.
The Summit is a series of live webcasts covering a range of topics on the latest trends and technologies in embedded control and monitoring applications. Its multiple technical sessions address some of the nastiest challenges in energy, power quality, condition monitoring, transportation, and machine control. Where appropriate, humans from the trenches, be they NI users or partners, describe how they deployed systems for advanced embedded control and monitoring.
The Summit kicks off with a presentation of the trends and challenges facing design teams building embedded control and monitoring systems. It then branches off into individual sessions, two in the morning and one in the afternoon. Days two and three have a three morning sessions and one after lunchtime.
Topics on the agenda include embedded system design techniques in smart, field-programmable control systems for the power grid; cost savings and efficiency through power quality monitoring; vehicle and equipment monitoring; best engineering practices for oil field control and monitoring applications; state-of-the-art machine control systems design strategies; planning for the future with a scalable ECU prototyping platform; driving productivity with graphical system design; saving money and decreasing downtime with vehicle and equipment monitoring; and increasing system efficiency with condition monitoring.
A version of the Summit from the spring will give you the idea of just how in-depth and timely the new presentations are intended to be. Take a look here. In fact, the spring summit makes this edition a tough act to follow. But the benefit of attending the new Embedded Technology Summit is that you can participate in the live Q&A at the end of a session. You don’t get that from a rebroadcast.
So, check out the agenda from the link over there. I can tell you that from reading the session descriptions, it seems that the Embedded Technology Summit will be a great event.
Thanks, Pal.—Lockwood
Anthony J. Lockwood
Editor at Large, Desktop Engineering
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About the Author
Anthony J. LockwoodAnthony J. Lockwood is Digital Engineering’s founding editor. He is now retired. Contact him via [email protected].
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