Scanning Slit Laser Beam Profiler Features USB2 Interface

Ophir Photonics announced NanoScan 2, the new version of its scanning slit beam profiler. A NIST-calibrated laser beam profiler, NanoScan 2 measures continuous wave (CW) and pulsed beams across the entire spectral range, from UV to far infrared. The system features a new USB2 interface that provides 12-bit digitization of the signal for enhanced dynamic range up to 35 dB power. An enhanced digital controller improves the accuracy and stability of measurements; beam size and beam pointing can now be measured with a 3 sigma precision of several hundred nanometers.

The profiler also features software controllable scan speed and a “peak-connect” algorithm that allow measurement of pulsed and pulse width modulated lasers with frequencies of a few kHz and higher with any detector. The ability to alter the drum speed helps increase the dynamic range, allowing a larger operating space for any given scanhead, the company says.

The NanoScan 2 system uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, without attenuation. Detector options (silicon, germanium, and pyroelectric technologies) allow measurement at wavelengths from ultraviolet to far infrared. It can simultaneously measure multiple beams and offers an optional power meter for scanheads with silicon and germanium detectors.

The solution also features an M2 Wizard for determining the times-diffraction propagation factor (M2) of a laser using the Rayleigh Method. A 200 mW power meter option can be calibrated against the user’s ISO- or NIST traceable power meter, as well.

For more information, visit Ophir Photonics.

Sources: Press materials received from the company and additional information gleaned from the company’s website.