Nikon Announces MCT225 Metrology CT System

By DE Editors

Nikon Metrology’s new Metrology CT system, MCT225,  provides Metrology CT for a wide range of sample sizes and material densities with 9+ L/50 µm accuracy in accordance with the VDI/VDE 2630 guideline. All internal and external geometry is measured efficiently in a single non-destructive process. A full 3D visualization of the sample volume additionally provides valuable insights into part deformations and internal structural integrity.

MCT225 is pre-calibrated using accuracy standards traceable to the UK’s national measurement institute (NPL) and verified using VDI/VDE 2630 guidelines for Computed Tomography in Dimensional Measurement.Absolute accuracy guarantees measurement accuracy without time consuming comparative scans or reference measurements; samples are simply placed on a rotary table inside the enclosure and measured.

According to the company, a key component of the MCT225 system is the in-house developed Nikon Metrology 225 kV micro-focus X-ray source. It produces sharp images with low noise levels, enabling magnification levels up to 150x with 2 µm feature detection.

High-precision linear guideways equipped with high-resolution optical encoders are error corrected using the laser interferometer mapping techniques employed for CMMs. For optimal accuracy and long term stability, finite element analysis (FEA) was used during the design phase to optimize the stiffness of the manipulator.

For more information, visit Nikon Metrology.

Sources: Press materials received from the company and additional information gleaned from the company’s website.