Latest News
March 28, 2013
The 2013 release offers dual-device inspection options that allow measurement with two portable devices at the same time. This is an extension of the functionality for dual-column CMMs included in the 2012 R2 release.
Other enhancements include improved handling of point-cloud data, group editing of probing parameters, graphical editing of boundaries for raster-based inspection, more flexibility in programming dual-column CMMs, and easier measurement and marking out when using PowerINSPECT for clay modelling.
For more information, visit Delcam.
Sources: Press materials received from the company and additional information gleaned from the company’s website.
Subscribe to our FREE magazine,
FREE email newsletters or both!Latest News
About the Author
DE EditorsDE’s editors contribute news and new product announcements to Digital Engineering.
Press releases may be sent to them via [email protected].