Agilent Announces Wireless Communications Test Set

By DE Editors

Agilent Technologies has introduced the E6607B EXT wireless communications test set and companion E6617A multi-port adapter. Optimized for non-signaling testing, the company says the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of smartphones and tablets that contain multi-format and multi-band technologies.
 
The EXT is an integrated one-box tester that includes a vector signal analyzer, vector signal generator, high-speed sequence analyzer and multi-format hardware. It offers full cellular-band coverage up to 3.8 GHz (including LTE TDD Band 43) and support for the fast-sequenced test modes implemented in the latest chipsets.
 
The compact MPA adds simultaneous receiver testing, sequential transmitter testing and simultaneous GPS testing of up to four dual-antenna devices at a time. It does this through plug-and-play connectivity to the EXT and fully calibrated ports that extend the test plane to the MPA front panel.

The EXT can be configured with a variety of X-Series measurement applications for cellular communications, wireless connectivity and digital audio/video. The new EXT test set includes three additions: LTE TDD, TD-SCDMA and analog demodulation. Individual X-Series measurement applications can be included with the original instrument purchase or added later.
 
The E6607B is fully backward compatible with the previous-generation E6607A EXT.

For more information, visit Agilent Technologies.

Sources: Press materials received from the company and additional information gleaned from the company’s website.